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Federal Forensic Associates, Inc.

JOEL

JSPM-4200

The Atomic Force Microscopy allows for discrimination of surface features at the atomic level. This methodology is useful for the determination of line sequence and the characterization of surface features such as staple marks, creases in paper or other irregularities in the paper surface.

Scanner Select among four scanners with scan ranges up to 200ĩm square x-y imaging area and up to 10ĩm vertical range

Sample Size Up to 15mm diameter and up to 5mm thick Tip/Cantilever Holders:

Tip/Cantilever Holders Tapping Mode (air) Cantilever Holder
Force Modulation and Tapping Mode (fluid)
Electric Force Cantilever Holder
STM Converter
Low-Current STM Converter

Isolation Silicone Vibration Pad
Acoustic cover

Controller Electronics Digital Signal Processor (DSP) with a 20MHz peak rate for arithmetic operations
x, y, and z scanner drives with ą220V range
Three independent 16-bit DACs on each axis for scan pattern, scaling, and offset
Scan calibration maintained regardless of scan size or offset
Calibrated data from both the trace and retrace lines of a scan simultaneously displayed and captured
Display of both the up-to-down scan and the down-to-up scan for protection against drift artifacts
x-y electronic noise <1mV peak-to-peak for 10V scan independent of offset
Four auxiliary DACs, three with ą10V outputs and one with ą12V and ą220V outputs, all with 16-bit resolution
Two ą10V ADCs with 14-bit resolution and software-selectable filters; one input has four-way multiplexing

Contact Federal Forensic Associates FFA@InkDating.com